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商品の説明
内容説明
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Book Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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Since the invention of atomic force microscopy (AFM) in 1986 by G.Binnig and coworkers at Stanford University [1|, AFM has rapidly developed into a powerful and invaluable surface analysis technique on micro- and nanoscales and even on atomic and molecular scales. 最初のページを読む
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Since the invention of atomic force microscopy (AFM) in 1986 by G.Binnig and coworkers at Stanford University [1|, AFM has rapidly developed into a powerful and invaluable surface analysis technique on micro- and nanoscales and even on atomic and molecular scales. 最初のページを読む
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